Are you sure you want to leave this community? Leaving the community will revoke any permissions you have been granted in this community.
SciCrunch Registry is a curated repository of scientific resources, with a focus on biomedical resources, including tools, databases, and core facilities - visit SciCrunch to register your resource.
| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Rigaku WDA-3650 spectrometer Resource Report Resource Website |
Rigaku WDA-3650 spectrometer (RRID:SCR_020489) | instrument resource | Simultaneous WDXRF spectrometer film thickness and composition measurements on wafers and media disks. | Rigaku, Semiconductor Metrology, Instrument Equipment, USEDit, | Commercially available | Model_Number_WDA-3650 | SCR_020489 | 2026-02-14 02:04:27 | 0 | ||||||||||
|
Sony SY3200 Cell Sorter Resource Report Resource Website |
Sony SY3200 Cell Sorter (RRID:SCR_020522) | instrument resource | SY3200 cell sorter platform is expandable to a dual system layout, effectively enabling two systems in one. | Sony, Cell Sorter, Instrument Equipment, USEDit | Commercially available | SCR_020528, Model_Number_SY3200 | SCR_020522 | 2026-02-14 02:04:05 | 0 | ||||||||||
|
Rigaku TMA8311 Thermal Analyzer Resource Report Resource Website |
Rigaku TMA8311 Thermal Analyzer (RRID:SCR_020486) | instrument resource | Thermomechanical analyzer. Measurement of a mechanical property change with respect to temperature. | Rigaku, Thermal Analysis, Instrument Equipment, USEDit, | Commercially available | Model_Number_TMA8311 | SCR_020486 | 2026-02-14 02:03:57 | 0 | ||||||||||
|
Rigaku WaferX 310 spectrometer Resource Report Resource Website |
Rigaku WaferX 310 spectrometer (RRID:SCR_020487) | instrument resource | In line, simultaneous WDXRF spectrometer film thickness and composition measurements on blanket wafers. | Rigaku, Semiconductor Metrology, Instrument Equipment, USEDit, | Commercially available | Model_Number_WaferX 310 | SCR_020487 | 2026-02-14 02:04:25 | 0 | ||||||||||
|
Sorvall Legend RT Centrifuge Resource Report Resource Website |
Sorvall Legend RT Centrifuge (RRID:SCR_020520) | instrument resource | Legend RT is a general-purpose tabletop centrifuge for biotechnological and pharmaceutic research. .The user-friendly "QUIKset" control panel permits easy selection of speed, RCF value, run time and deceleration profile, as well as temperature of the Legend RT. You can switch from speed to RCF display and vice versa, with a touch of a button and even during a run | Sorvall, Centrifuge, Instrument Equipment, USEDit | Commercially available | Model_Number_Legend RT | SCR_020520 | 2026-02-14 02:03:57 | 0 | ||||||||||
|
Struers Lectro Pol 5 electropolisher Resource Report Resource Website |
Struers Lectro Pol 5 electropolisher (RRID:SCR_020529) | instrument resource | LectroPol-5 is designed for automated electrolytic polishing and etching of metallographic specimens. A scanning function for easy determination of parameters, built-in safety features, and a database with methods for various materials enables short polishing times and maximum reproducibility. LectroPol-5 consists of two units, the control unit and the polishing unit. The two units can be separated from each other. LectroPol-5 features a scanning function that helps to determine the correct voltage for both polishing and etching, thus saving time and avoiding human error. LectroPol-5 displays the scan curve, while the user selects and sets the voltage. The LectroPol-5 comes with ten polishing/etching methods for various materials, enabling immediate preparation of a wide range of materials without any lengthy and time-consuming trials. | Struers, Electropolisher, Instrument Equipment, USEDit | Commercially available | Model_Number_LectroPol-5 | SCR_020529 | 2026-02-14 02:04:27 | 0 | ||||||||||
|
Tencore KLA P-10 Surface Profiler Resource Report Resource Website |
Tencore KLA P-10 Surface Profiler (RRID:SCR_020535) | instrument resource | Computer controlled manual wafer load profilometer with Max wafer size of 8"/200mm that measures roughness, waviness, step height, and other surface characteristics. Capabilities of this instrument include: Measurement of vertical features ranging from under 100Ã… (0.4 min.) to approximately 300 �m (11 mils), with a vertical resolution of 0.5, 2, or 10Ã…, A virtually unlimited number of data points per profile guarantee that the horizontal resolution is limited by the stylus radius and not by the number of data points, Measurement of many roughness and waviness parameters, with user-selectable cutoff filters to isolate roughness and waviness, Ability to fit and level a scan, allowing accurate step height measurements on curved surfaces, and the Ability to detect the edge or apex of a profile feature, allowing automated data analysis relative to the feature. The KLA P-10 to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements. KLA-Tencor P10 can profile a variety of materials including: Semiconductor wafers, Thin-film heads, Precision-machined and polished surfaces, Ceramics for micro-electronics, Glass for flat panel displays, and Optical surfaces | Tencore, Surface Profiler, Instrument Equipment, USEDit | Commercially available | Model_Number_P-10 | SCR_020535 | 2026-02-14 02:04:06 | 0 | ||||||||||
|
Rigaku ZSX Primus spectrometer Resource Report Resource Website |
Rigaku ZSX Primus spectrometer (RRID:SCR_020497) | instrument resource | Sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films, from beryllium Be through uranium U | Rigaku, WDXRF, Instrument Equipment, USEDit, | Commercially available | Model_Number_ZSX Primus | SCR_020497 | 2026-02-14 02:04:28 | 0 | ||||||||||
|
Siemens 3T Magnetom Skyra MRI scanner Resource Report Resource Website 1+ mentions |
Siemens 3T Magnetom Skyra MRI scanner (RRID:SCR_020530) | instrument resource | Siemens 3T MAGNETOM Skyra scanner with new software that enables rapid imaging. | Siemens, Whole Body MRI, Instrument Equipment, USEDit | Commercially available | Model_Number_Skyra | SCR_020530 | 2026-02-14 02:04:06 | 5 | ||||||||||
|
Thermo 3000 Plate Sealer Resource Report Resource Website |
Thermo 3000 Plate Sealer (RRID:SCR_020539) | instrument resource | Quickly seal in heat with the Thermo Scientific ALPS 3000 Automated Microplate Heat Sealer. This compact sealer is designed for optimal robotic integration in high throughput labs, yet still allows for manual benchtop control. | Thermo, Plate Sealer, Instrument Equipment, USEDit | Commercially available | Model_Number_ALPS 3000 | SCR_020539 | 2026-02-14 02:04:27 | 0 | ||||||||||
|
Rigaku SmartLab diffractometer Resource Report Resource Website 1+ mentions |
Rigaku SmartLab diffractometer (RRID:SCR_020473) | instrument resource | Automated multipurpose X-Ray diffractometer with guidance software. Power diffraction, thin film metrology, SAXS, in plane scattering, and operando measurements. | Rigaku, XRD, Instrument Equipment, USEDit, | Commercially available | Model_Number_SmartLab | SCR_020473 | 2026-02-14 02:04:27 | 3 | ||||||||||
|
Rigaku SmartSite RS analyzer Resource Report Resource Website |
Rigaku SmartSite RS analyzer (RRID:SCR_020474) | instrument resource | Non destructive portable stress analyzer for field and indoor use. | Rigaku, Stress Analysis, Instrument Equipment, USEDit, | Commercially available | Model_Number_SmartSite RS | SCR_020474 | 2026-02-14 02:03:56 | 0 | ||||||||||
|
Rigaku Progeny Handheld Raman spectrometer Resource Report Resource Website |
Rigaku Progeny Handheld Raman spectrometer (RRID:SCR_020471) | instrument resource | Advanced 1064 NM handheld raman spectrometer for raw material identification, material verification and authentication. | Rigaku, Raman, Instrument Equipment, USEDit, | Commercially available | Model_Number_Progeny | SCR_020471 | 2026-02-14 02:04:25 | 0 | ||||||||||
|
Rigaku ZSX Primus IV Resource Report Resource Website |
Rigaku ZSX Primus IV (RRID:SCR_020503) | instrument resource | Tube above sequential WDXRF spectrometer with elemental analysis of solids, liquids, powders, alloys and thin films, from beryllium Be through uranium U | Rigaku, WDXRF, Instrument Equipment, USEDit, | Commercially available | Model_Number_ZSX Primus IV | SCR_020503 | 2026-02-14 02:04:26 | 0 | ||||||||||
|
Rigaku RV-5020 Resource Report Resource Website |
Rigaku RV-5020 (RRID:SCR_020468) | instrument resource | Foreign object X ray inspection instrument. | Rigaku, Non-Destructive Testing, Instrument Equipment, USEDit, | Commercially available | Model_Number_RV-5020 | SCR_020468 | 2026-02-14 02:04:05 | 0 | ||||||||||
|
Rigaku ResQ CQL Raman detector Resource Report Resource Website |
Rigaku ResQ CQL Raman detector (RRID:SCR_020469) | instrument resource | New 1064 NM handheld raman analyzer for explosives and narcotics detection fast chemical detection | Rigaku, Raman, Instrument Equipment, USEDit, | Commercially available | Model_Number_ResQ CQL | SCR_020469 | 2026-02-14 02:04:27 | 0 | ||||||||||
|
Sanyo MCO-19AIC UV CO2 Incubator Resource Report Resource Website |
Sanyo MCO-19AIC UV CO2 Incubator (RRID:SCR_020509) | instrument resource | Incubator features humidity and temperature control technology, which provides both stability control for cultures. The direct heat and air jacket system eliminate the inconvenient use of water in the incubator and provides heat from the door, side, and bottom of the unit. The Sanyo MCO-19AIC utilizes a dual detector infrared CO2 sensor, which is not affected by changes in humidity or temperature, maintains constant conditions via the microprocessor control, and automatically calibrates using room air temperature as reference. Also features Safe Cell UV contamination control system. | Sanyo, Incubator, Instrument Equipment, USEDit | Commercially available | Model_Number_MCO-19AIC | SCR_020509 | 2026-02-14 02:04:05 | 0 | ||||||||||
|
Rigaku TXRF-V310 Resource Report Resource Website |
Rigaku TXRF-V310 (RRID:SCR_020484) | instrument resource | Wafer surface contamination metrology by VPD TXRF with measurement of ultra trace elemental surface contamination. | Rigaku, Semiconductor Metrology, Instrument Equipment, USEDit, | Commercially available | Model_Number_TXRF-V310 | SCR_020484 | 2026-02-14 02:04:05 | 0 | ||||||||||
|
Rigaku UltraX 18 generator Resource Report Resource Website |
Rigaku UltraX 18 generator (RRID:SCR_020485) | instrument resource | 18 kW rotating anode X-ray generator. A high powered X-ray source that can produce point or line focus X-ray beams. | Rigaku, X-Ray Source, Instrument, Resource Equipment, Equipment, USEDit, | Commercially available | Model_Number_UltraX 18 | SCR_020485 | 2026-02-14 02:04:27 | 0 | ||||||||||
|
Rigaku Supermini200 spectrometer Resource Report Resource Website |
Rigaku Supermini200 spectrometer (RRID:SCR_020483) | instrument resource | High power benchtop sequential WDXRF spectrometer.Used for elemental analysis of solids, liquids, powders, alloys and thin films. | Rigaku, WDXRF, Wavelength Dispersive X-Ray Florescence, Instrument, Equipment, USEDit | Commercially available | Model_Number_Supermini200 | SCR_020483 | 2026-02-14 02:04:25 | 0 |
Can't find your Tool?
We recommend that you click next to the search bar to check some helpful tips on searches and refine your search firstly. Alternatively, please register your tool with the SciCrunch Registry by adding a little information to a web form, logging in will enable users to create a provisional RRID, but it not required to submit.
Welcome to the NIF Resources search. From here you can search through a compilation of resources used by NIF and see how data is organized within our community.
You are currently on the Community Resources tab looking through categories and sources that NIF has compiled. You can navigate through those categories from here or change to a different tab to execute your search through. Each tab gives a different perspective on data.
If you have an account on NIF then you can log in from here to get additional features in NIF such as Collections, Saved Searches, and managing Resources.
Here is the search term that is being executed, you can type in anything you want to search for. Some tips to help searching:
If you are logged into NIF you can add data records to your collections to create custom spreadsheets across multiple sources of data.
Here are the facets that you can filter the data by.
If you have any further questions please check out our FAQs Page to ask questions and see our tutorials. Click this button to view this tutorial again.