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URL: https://www.microscop.ru/uploads/Helios-NanoLab-600i-ds-web.pdf
Proper Citation: FEI Helios Nanolab 600i DualBeam (RRID:SCR_027033)
Description: Scanning Electron Microscope advanced DualBeam for ultra-high resolution imaging, analysis and fabrication at the nanoscale. Helios NanoLab 600i builds on the success of FEI’s winning DualBeam series offering advances in ion beam, electron beam, patterning and range of features to make milling, imaging, analysis and sample preparation down to nanoscale.
Synonyms: FEI Helios NanoLab 600i DuaBeam, , FEI Helios NanoLab 600i DuaBeam Scanning Electron Microscope, Helios NanoLab 600i
Resource Type: instrument resource
Keywords: Scanning Electron Microscope, imaging, analysis, nanoscale, microscope, electron microscope,
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