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URL: https://www.yxlon.com/en/products/x-ray-and-ct-inspection-systems/yxlon-ff65-cl
Proper Citation: YXLON FF65 CL 3D X-Ray (RRID:SCR_020910)
Description: X ray inspection system for automatic analysis of smallest and most demanding features within 3D IC, MEMS and sensors.
Resource Type: instrument resource
Keywords: YXLON, 3D X-Ray, Instrument Equipment, USEDit,
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