Are you sure you want to leave this community? Leaving the community will revoke any permissions you have been granted in this community.
URL: https://www.rigaku.com/products/semi/azx400
Proper Citation: Rigaku AZX 400 (RRID:SCR_020439)
Description: Sequential wavelength dispersive XRF spectrometer for large samples film thickness and composition measurements on large and heavy samples, wafers, and media disks.
Resource Type: instrument resource
Keywords: Rigaku, Spectrometer, Instrument, Equipment, USEDit,
Expand AllWe found {{ ctrl2.mentions.all_count }} mentions in open access literature.
We have not found any literature mentions for this resource.
We are searching literature mentions for this resource.
Most recent articles:
{{ mention._source.dc.creators[0].familyName }} {{ mention._source.dc.creators[0].initials }}, et al. ({{ mention._source.dc.publicationYear }}) {{ mention._source.dc.title }} {{ mention._source.dc.publishers[0].name }}, {{ mention._source.dc.publishers[0].volume }}({{ mention._source.dc.publishers[0].issue }}), {{ mention._source.dc.publishers[0].pagination }}. (PMID:{{ mention._id.replace('PMID:', '') }})
A list of researchers who have used the resource and an author search tool
A list of researchers who have used the resource and an author search tool. This is available for resources that have literature mentions.
No rating or validation information has been found for Rigaku AZX 400.
No alerts have been found for Rigaku AZX 400.
Source: SciCrunch Registry