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URL: https://www.jeolusa.com/PRODUCTS/Transmission-Electron-Microscopes-TEM/200-kV/JEM-F200-F2
Proper Citation: Jeol JEM-F200 F2 Transmission Electron Microscope (RRID:SCR_020175)
Description: Transmission scanning electron microscope that offers Cold Field Emission Gun and dual Silicon Drift Detectors
Resource Type: instrument resource
Keywords: Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit,
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