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URL: https://www.jeolusa.com/PRODUCTS/Transmission-Electron-Microscopes-TEM/300-kV/JEM-ARM300F
Proper Citation: Jeol JEM-ARM300F Transmission Electron Microscope (RRID:SCR_020174)
Description: Transmission electron microscope that is designed to meet most advanced materials development requirements for atom by atom characterization and chemical mapping
Resource Type: instrument resource
Keywords: Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit,
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