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URL: https://www.fei.com/products/sem/Verios-G4-XHR-SEM-for-Materials-Science/
Proper Citation: FEI Verios 5 XHR SEM (RRID:SCR_019914)
Description: Microscope that is used for characterization of nanomaterials with sub nanometer resolution and high material contrast SEM.
Resource Type: instrument resource
Keywords: FEI, SEM, Instrument Equipment, USEDit,
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