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URL: https://link.springer.com/article/10.1007%2Fs00424-017-2067-y
Proper Citation: Surface Modified Amperometry CMOS IC (RRID:SCR_017082)
Description: Integrated circuit device used as tool for amperometry measurement as replacement of conventional carbon fiber microelectrode. Surface modified structures with SU 8 microwells increases life span of each individual device and achieves single cell measurement efficiency by trapping cells inside microwells.
Synonyms: Surface Modified Amperometry Complementary Metal Oxide Semiconductor IC
Resource Type: instrument resource
Defining Citation: PMID:28889250
Keywords: instrument, device, CMOS, amperometry, measurement, chip, microelectrode, microwell, cell, semiconductor
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